Photophysics of Distinguished Defect States in Bi2O2Se Thin Films
Xiaoran Niu, Hao Li, Leyang Dang, Ruoying Pang, Xin Meng, Adeela Nairan, Huarui Sun, Jingkai Qin, Usman Khan, Xiaochuan Xu, Guigen Wang, Feng He · 2026
Read Photophysics of Distinguished Defect States in Bi2O2Se Thin Films by Xiaoran Niu, Hao Li, Leyang Dang, Ruoying Pang, Xin Meng, Adeela Nairan, Huarui Sun, Jingkai Qin, Usman Khan, Xiaochuan Xu, Guigen Wang, Feng He (2026) in the Tower of Babel, a free online library of public-domain works preserved in clean, searchable text. No sign-up. The full text is served as a plain-text file at a predictable URL, where text is present: https://antarctic-labs.com/tower-of-babel/pmc-13672171.txt.
Description
Xiaoran Niu and co-authors probe flaws inside thin films of a promising new material for electronics, in a 2026 study. The layered material moves charge fast and stands up to air, which makes it a strong pick for future devices. Tiny flaws in its crystal, though, can change how it behaves, and their roles were unclear.
Using light-based tests on films of two thicknesses, the team sorted two common flaws by how they trap charge. One flaw gives charge freely, while the other holds it deep, and the deep one grows stronger under bright light. Knowing which flaw does what can help growers tune films for high-power use.
Catalog record
| CREATOR | Xiaoran Niu, Hao Li, Leyang Dang, Ruoying Pang, Xin Meng, Adeela Nairan, Huarui Sun, Jingkai Qin, Usman Khan, Xiaochuan Xu, Guigen Wang, Feng He |
|---|---|
| YEAR | 2026 |
| COLLECTION | PAPERS |
| FORMAT | TXT |
| FILE SIZE | 30 KB |
| VERSION | 1.0 |
| LICENSE | CC BY 4.0 |
| RIGHTS | CC BY |
| SOURCE | Europe PMC |