Analysis of Failure Mechanism of Silicone Gel Under High Voltage and High Temperature Aging Conditions
Jiahui Zhang, Dongxin He · 2026
Read Analysis of Failure Mechanism of Silicone Gel Under High Voltage and High Temperature Aging Conditions by Jiahui Zhang, Dongxin He (2026) in the Tower of Babel, a free online library of public-domain works preserved in clean, searchable text. No sign-up. The full text is served as a plain-text file at a predictable URL, where text is present: https://antarctic-labs.com/tower-of-babel/PMC13511973.txt.
Description
Jiahui Zhang and Dongxin He investigate how silicone gel used to seal power electronic devices fails under high voltage and high heat, in 2026 work. The gel insulates modules that convert electric power, and long service under harsh loads eats into reliability and lifespan. The team aged samples under combined electrical and thermal stress, varying pulse edge speed and aging stage.
They tracked tree-like damage channels, breakdown strength, charge-driven molecular vibration, leakage current, and softness by cone penetration. Failure traced to two forces acting together: fast pulse edges drove repeated charge damage inside the gel, while heat broke down its part-solid, part-liquid structure. Each force alone explained only part of the decline. The authors say the paired mechanism gives a base for reformulating the gel and redesigning modules for longer sealing life.
Catalog record
| CREATOR | Jiahui Zhang, Dongxin He |
|---|---|
| YEAR | 2026 |
| COLLECTION | PAPERS |
| FORMAT | TXT |
| FILE SIZE | 44 KB |
| LICENSE | https://creativecommons.org/licenses/by/4.0 |
| RIGHTS | CC BY |
| SOURCE | Europe PMC |