Nanometre-precision terahertz interferometry for battery electrode metrology
Guseon Kang, Jaeyoon Kim, Mee-Ree Kim, Younggeun Lee, Dong-Chel Shin, Jinwoo Jeon, Hyeonwoo Kim, Dae Hee Kim, Joohyung Lee, Sangbaek Park, Young-Jin Kim · 2026
Read Nanometre-precision terahertz interferometry for battery electrode metrology by Guseon Kang, Jaeyoon Kim, Mee-Ree Kim, Younggeun Lee, Dong-Chel Shin, Jinwoo Jeon, Hyeonwoo Kim, Dae Hee Kim, Joohyung Lee, Sangbaek Park, Young-Jin Kim (2026) in the Tower of Babel, a free online library of public-domain works preserved in clean, searchable text. No sign-up. The full text is served as a plain-text file at a predictable URL, where text is present: https://antarctic-labs.com/tower-of-babel/PMC13402754.txt.
Description
Guseon Kang and colleagues gauge the thickness of battery electrodes with terahertz light, hitting nanometer precision without touching or cutting the sample. Factories need fast checks that do no damage, yet X-rays, sound, and lasers each fail on speed, fine detail, or depth into metal layers. Their setup bounces terahertz waves inside the electrode and reads the echo pattern against a light-based frequency comb with exact, standard-tied tuning.
Electrodes 50 to 150 micrometers thick were sized with small error bars: about 70 nanometers of doubt for anodes and 466 nanometers for cathodes in a fifth of a second. Longer averaging cut those doubts to about 8 and 25 nanometers. One setup also maps surfaces in three dimensions and follows thickness live as cells are made. The authors pitch the system as a no-calibration gauge for next-generation battery lines.
Catalog record
| CREATOR | Guseon Kang, Jaeyoon Kim, Mee-Ree Kim, Younggeun Lee, Dong-Chel Shin, Jinwoo Jeon, Hyeonwoo Kim, Dae Hee Kim, Joohyung Lee, Sangbaek Park, Young-Jin Kim |
|---|---|
| YEAR | 2026 |
| COLLECTION | PAPERS |
| FORMAT | TXT |
| FILE SIZE | 72377 |
| LICENSE | https://creativecommons.org/licenses/by/4.0 |
| RIGHTS | CC BY |
| SOURCE | Europe PMC |