Opto-optical edge defect mitigation in solution-processed WSe2 thin films for high-efficiency optical modulation
Jianan Li, Zefeng Xu, Yuan Chen, Chenxuan Zeng, Jie Yang, Jin Feng Leong, Maheswari Sivan, Baoshan Tang, Zhe Wang, Yuan Gao, Hong-Lin Lin, Arjun Kesav Mugilvannan, Evgeny Zamburg, Aaron Danner, Cheng-Wei Qiu, Goki Eda, Aaron Voon-Yew Thean · 2026
Read Opto-optical edge defect mitigation in solution-processed WSe2 thin films for high-efficiency optical modulation by Jianan Li, Zefeng Xu, Yuan Chen, Chenxuan Zeng, Jie Yang, Jin Feng Leong, Maheswari Sivan, Baoshan Tang, Zhe Wang, Yuan Gao, Hong-Lin Lin, Arjun Kesav Mugilvannan, Evgeny Zamburg, Aaron Danner, Cheng-Wei Qiu, Goki Eda, Aaron Voon-Yew Thean (2026) in the Tower of Babel, a free online library of public-domain works preserved in clean, searchable text. No sign-up. The full text is served as a plain-text file at a predictable URL, where text is present: https://antarctic-labs.com/tower-of-babel/pmc-13396675.txt.
Description
Jianan Li and others hush edge faults in wet-made tungsten selenide sheets for light switches in a 2026 study. Two-layer light switches oft lose punch to fault drain and weak light-grip.
Edge faults sprang from metal zones at sheet rims round semiconducting cores, but sheet size tuning plus light or spark drive slowly filled those trap states with carriers. Dark fade fell and glow response rose, lifting switch punch. The work hands thin-film switch craft a workable path to high punch and steadier long-run use for wear tech.
Catalog record
| CREATOR | Jianan Li, Zefeng Xu, Yuan Chen, Chenxuan Zeng, Jie Yang, Jin Feng Leong, Maheswari Sivan, Baoshan Tang, Zhe Wang, Yuan Gao, Hong-Lin Lin, Arjun Kesav Mugilvannan, Evgeny Zamburg, Aaron Danner, Cheng-Wei Qiu, Goki Eda, Aaron Voon-Yew Thean |
|---|---|
| YEAR | 2026 |
| COLLECTION | PAPERS |
| FORMAT | TXT |
| FILE SIZE | 47 KB |
| VERSION | 1.0 |
| LICENSE | CC BY 4.0 |
| RIGHTS | CC BY |
| SOURCE | Europe PMC |