Deciphering the hydrogen shuttle-mediated kinetic memory of Ge-related defects in UV-grade fused quartz via in situ EPR with 3D imaging
Xiaobing Lou, Fushan Geng, Kejiao Shi, Bingwen Hu · 2027
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Description
Xiaobing Lou and colleagues track light-made defects in UV-grade fused quartz in a 2027 study that pairs live EPR measures with 3D imaging. Their focus is germanium-linked defect centers in JGS2 quartz, a glass used in lasers and other optics. Repeated UV light changed how fast new defects formed, an effect the team calls kinetic memory.
A hydrogen shuttle moving between two defect forms explains the switch, with one form fading fast and the other lasting for months. Imaging showed that active defects stayed only in the zones lit by UV light. The work gives makers of silica optics a firmer way to judge how the glass holds up under repeated radiation.
Catalog record
| CREATOR | Xiaobing Lou, Fushan Geng, Kejiao Shi, Bingwen Hu |
|---|---|
| YEAR | 2027 |
| COLLECTION | PAPERS |
| FORMAT | TXT |
| FILE SIZE | 37159 |
| LICENSE | https://creativecommons.org/licenses/by/4.0 |
| RIGHTS | CC BY |
| SOURCE | Europe PMC |