Low‐Dose Electron Total Scattering Analysis Resolves Non‐Crystalline Phase Separation in Polymer Semiconductors and Device Multilayers
Sang T. Pham, Adam F. Sapnik, Sean M. Collins · 2026
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Description
Sang Pham, Adam Sapnik, and Sean Collins show in 2026 how gentle electron scattering can reveal phase separation in plastic semiconductor blends that lack crystals, even inside whole device stacks. Blends that split into domains age badly, but telling apart two near identical plastics defeats most imaging tools. Their low dose method reads scattering patterns pixel by pixel.
In partly crystalline blends it named the phases and their grain directions. In fully glassy blends, a standard pair analysis fell short, so the team used angle based scattering tied to computed molecular signals to map the two phases cleanly. A frozen cut through a model device showed the full workflow. The suite can separate splitting from crystal growth.
Catalog record
| CREATOR | Sang T. Pham, Adam F. Sapnik, Sean M. Collins |
|---|---|
| YEAR | 2026 |
| COLLECTION | PAPERS |
| FORMAT | TXT |
| FILE SIZE | 76 KB |
| VERSION | 1.0 |
| LICENSE | CC BY 4.0 |
| RIGHTS | CC BY |
| SOURCE | Europe PMC |