Considering AEWMA control chart applied to Gamma-distributed data with fixed and variable sampling intervals
Shin-Li Lu, Meng-Chiao Chen, Jen-Hsiang Chen, Su-Fen Yang, Kashinath Chatterjee · 2025
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Description
Shin-Li Lu and four co-authors published a study in 2025 on factory control charts that adapt to skewed data. Factories watch a running chart to catch small drifts before they become defects. Classic charts react slowly to small shifts, while weighted charts lag on sudden jumps. An adaptive version adjusts its own sensitivity, and this team applied it to data that follow a lopsided gamma pattern, common for lifetimes and waiting times.
A classic transformation first tamed the skew toward normality. Simulations then compared fixed and variable checking intervals across many shapes and settings. Judged by time to signal rather than samples taken, the variable-interval adaptive chart won on both sensitivity and stability. Chip makers tracking current stability are among the intended users.
Catalog record
| CREATOR | Shin-Li Lu, Meng-Chiao Chen, Jen-Hsiang Chen, Su-Fen Yang, Kashinath Chatterjee |
|---|---|
| YEAR | 2025 |
| COLLECTION | PAPERS |
| FORMAT | TXT |
| FILE SIZE | 204 KB |
| VERSION | 1.0 |
| LICENSE | CC BY 4.0 |
| RIGHTS | CC BY |
| SOURCE | Europe PMC |