Two-Step Image Registration for Dual-Layer Flat-Panel Detectors
Dong Sik Kim, Dayeon Lee, Georg Böning, Johannes Kahn · 2024
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Description
Dong Sik Kim and co-authors present a 2024 method to align paired X-ray images from a two-layer detector. One shot through such a detector gives two spectral views at once. If the views sit out of line, image quality gains are lost. Old alignment tools vary in accuracy by scene and blur fine detail with their fill-in math.
The new method works in two steps. First it shifts one view by a hair using a frequency trick. Then it rescales the view with smooth fill-in. Tests showed cleaner alignment than one-step tools and a quality gain of more than half over a single-layer detector at one dose grade. A chest image case shows the gain in practice.
Catalog record
| CREATOR | Dong Sik Kim, Dayeon Lee, Georg Böning, Johannes Kahn |
|---|---|
| YEAR | 2024 |
| COLLECTION | PAPERS |
| FORMAT | TXT |
| FILE SIZE | 35 KB |
| VERSION | 1.0 |
| LICENSE | CC BY 4.0 |
| RIGHTS | CC BY |
| SOURCE | Europe PMC |