Analysis of Plasmon Loss Peaks of Oxides and Semiconductors with the Energy Loss Function
Jean-Marc Costantini, Joël Ribis, Dong-Joo Kim, Albena Paskaleva · 2023
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Description
When an electron beam knocks energy out of a material, the pattern of losses tells how the material's electrons move together. Jean-Marc Costantini and Joel Ribis review that pattern, the energy loss function, in a 2023 paper. Their focus is plasmon peaks, the collective sloshing of electrons, in oxides and semiconductors used in electronics and nuclear settings.
The paper sets out the classic Drude-Lindhard theory, then weighs measured spectra against computer predictions for a set of insulating oxides and semiconductors. Fresh microscope data on silicon, silicon carbide, and cerium oxide are read through the same lens, yielding plasmon energies that a simple free-electron picture explains well. Radiation damage enters too: heavy ion hits push the plasmon peaks of silicon and its carbide downward as the crystals turn glassy. The review ties the shifts to structural damage.
Catalog record
| CREATOR | Jean-Marc Costantini, Joël Ribis, Dong-Joo Kim, Albena Paskaleva |
|---|---|
| YEAR | 2023 |
| COLLECTION | PAPERS |
| FORMAT | TXT |
| FILE SIZE | 38 KB |
| VERSION | 1.0 |
| LICENSE | CC BY 4.0 |
| RIGHTS | CC BY |
| SOURCE | Europe PMC |