Computerized microstrain test system
Unknown · 2013
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Description
J. W. Lyons and three co-workers at the Electronics Research Center in Cambridge, Massachusetts, wrote this report in April 1970. It describes a computerized system for measuring very small strains in test materials. The system can sense changes at the scale of a microinch.
A capacitance bridge takes the readings on its own, linked to a computer. The setup measures lasting bends, loop areas from loading cycles, and total strain energy. Tests use the normal load-and-release pull method. The report also covers how the system was simulated, calibrated, and where its errors can arise.
Catalog record
| CREATOR | Unknown |
|---|---|
| YEAR | 2013 |
| COLLECTION | PAPERS |
| FORMAT | TXT |
| FILE SIZE | 32 KB |
| LICENSE | Public Domain |
| RIGHTS | PUBLIC DOMAIN |
| SOURCE | NASA NTRS |